WebDektak XT探针式轮廓仪. DektakXT®探针式轮廓仪采用革命性的台式设计,可实现 4Å (0.4nm) 的无与伦比的重复性,扫描速度可提高 40%。. 探针式轮廓仪性能的这一重大 … WebThe DekTak3 is a new computer-controlled surface profile measuring system, which accurately measures step heights from below 100 A to over 50 µm by moving a diamond-tipped stylus over the surface. Equipped with video camera and surface profile analysis software. News.
Contact-type Surface Roughness/Profile Measuring Instruments
The Dektak is a profilometer for measuring step heights or trench depths on a surface. This is a surface contact measurement technique where a very low force stylus is dragged across a surface. The display range of the data is 200 Å to 655,000 Å (65.5 um) with a vertical resolution of ~ 5 Å. The lateral resolution is limited by the tip shape. Webブルカー製スタイラスプロファイラ”DektakXT”の特徴は、4Å以下という段差測定再現性を実現する革新的なデザインに表れています。この大きな進歩は、Dektakの50年以上に … caqh facility application
Wyko Veeco surface Optical Profiler measuring eBay
WebThe approximate film thickness and surface roughness were determined with a Dektak3 profilometer. Ellipsometry. A Sopra (GES-5) spectroscopic ellipsometer with a wavelength tunability of 250 to 2000nm was used. Data was acquired in units of eV, using the analyzer in a previous tracking mode and with the integration time for each data point ... Web40年以上業界をリードしてきたDektakシリーズの第10世代目の最新触針式表面形状測定機(触針式表面粗さ計)。シングルアーチ設計とスマート・エレクトロニクスにより測定再 … WebThe Fig. 1 shows the thickness measurement of the catalyst nano layer for the three samples by Dektak3 profilometer. Fig.1 (a) shows the 21.6 nm thickness for the first sample. Fig. 1(b) and Fig ... caqh company